- Scanning Electron Microscope (SEM): JEOL JSM-6340FS, JSM-6700F
- Transmission Electron Microscope (TEM): JEOL JEM-1010
- Scanning Transmission Electron Microscopy (STEM): JEOL JEM-2100F
- X-ray Photoelectron Spectroscopy (XPS): KRATOS ESCA-3400
- X-ray Diffraction Instrument (XRD): RIGAKU Ultima IV/285/DX
- Microfocus X-ray and CT Inspection System (XCT): BEAMSENSE FLEX-M345
- Atomic Force Microscope (AFM): Multimode Nanoscope IIIa
- Confocal Laser Microscope: Keyence VK-8500
- Micro Compression Testing Machine: Shimadzu MCTM-500
