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Facilities

  • Scanning Electron Microscope (SEM): JEOL JSM-6340FS, JSM-6700F
  • Transmission Electron Microscope (TEM): JEOL JEM-1010
  • Scanning Transmission Electron Microscopy (STEM): JEOL JEM-2100F
  • X-ray Photoelectron Spectroscopy (XPS): KRATOS ESCA-3400
  • X-ray Diffraction Instrument (XRD): RIGAKU Ultima IV/285/DX
  • Microfocus X-ray and CT Inspection System (XCT): BEAMSENSE FLEX-M345
  • Atomic Force Microscope (AFM): Multimode Nanoscope IIIa
  • Confocal Laser Microscope: Keyence VK-8500
  • Micro Compression Testing Machine: Shimadzu MCTM-500

機器分析室装置