Facilities
- Scanning Electron Microscope (SEM): JEOL JSM-6340FS
- Transmission Electron Microscope (TEM): JEOL JEM-1010
- X-ray Photoelectron Spectroscopy (XPS): KRATOS ESCA-3400
- X-ray Diffraction Instrument (XRD): RIGAKU Ultima IV/285/DX, Multiflex/CE
- Confocal Laser Microscope: Keyence VK-8500
- Micro Compression Testing Machine: Shimadzu MCTM-500
- Microfocus X-ray and CT Inspection System (XCT): BEAMSENSE FLEX-M345 (Katsura Yui)
- Scanning Transmission Electron Microscopy (STEM): JEOL JEM-2100F (Katsura Yui)